Advanced SI Design Kit (ADK)

More than 25+ SI Apps in one place: Fill in DC and correct passivity, reciprocity and causality errors in Touchstone files; Convert S parameters into TDR/TDT waveforms; Plot eye diagrams; Convert S parameters into tabular RLGC models; Convert S parameters into equivalent SPICE models; Combine multiple .snp files; Channel Operating Margin (COM) for IEEE 802.3; Delta-L calculation with curvefitted equation; Material Property Extraction (or MPX to extract DK, DF and roughness); IEEE and OIF compliance testing; ccICN calculation; 2D field solver; S-param viewer; Batch mode and more.